Planning and related links
Frequently Asked Questions
Version 0.485
"La générosité est l'art d'engendrer la liberté
de l'autre"
Copyleft of René Descartes ( 1596-1650 )
II. Instrumental equations
II.1. Description of the polarized light
II.2. Matrix representations of optics
II.3. Photodetection
III. Simple measures of polarization
III.1. Measure by cancellation (Nulling polarimetry)
(Sénarmont)
III.2. Stokes's parameters measurements
IV. Measures of distance
IV.1. Picometer by ellipsometry
IV.2. Interferometry and
ellipsometry
IV.3. Picometers over kilometers
V Thin film ellipsometry
V.1. Nulling Ellipsometry
V.2. Rotating birefringent
ellipsometer
V.3. Interpretation of measures
(commented multilayer algorithms)
V.4. Precision of the measures
of thicknesses for thin films
VI. Examples of ellipsometric measurements
VI.1. Kinetics of oxidation of the silicon
VI.2. Compaction of lithographic resist
VI.3. Cartography of siliciure of germanium
VII. Photoelasticity
VII.1.
Stresses and Strains in thin films
VII.2.
Chromatic dispersion of photoelasticity